Light and Transmission Electron Microscope Basics

This course provides a foundational understanding of light microscopy and transmission electron microscopy (TEM), two essential techniques for imaging and analyzing microstructures in materials and biological specimens. Designed for students and early-career researchers, the course introduces the operating principles, instrumentation, and applications of both light and electron microscopy. The first part of the course focuses on light microscopy, covering concepts such as magnification, resolution, contrast mechanisms (bright field, dark field, and phase contrast), and sample preparation methods. Emphasis is placed on optical limitations, imaging artifacts, and practical usage in routine lab analysis. The second part introduces transmission electron microscopy, delving into electron-matter interactions, beam generation, electromagnetic lenses, and image formation. Students will learn how to interpret TEM images, understand diffraction patterns, and appreciate the high-resolution capabilities of electron microscopy. By the end of the course, students will be equipped with the fundamental knowledge and practical awareness required to select appropriate microscopy techniques, prepare samples effectively, and critically interpret microscopic images for research and development purposes. This intensive course introduces the core principles and practical aspects of light and transmission electron microscopy (TEM), focusing on their applications in materials characterization. Designed for professionals, researchers, and graduate students, the course offers a concise overview of imaging fundamentals, resolution limits, contrast mechanisms, and sample preparation techniques. Participants will learn how to operate optical microscopes for routine inspection and understand the capabilities of TEM for high-resolution analysis of microstructures, interfaces, and defects. Key topics include diffraction patterns, beam-sample interactions, and contrast interpretation. Emphasis is placed on selecting the right technique for specific applications and recognizing imaging artifacts.